A study on the robustness of Pseudo Random Binary Array based surface characterization
Conference Paper
(1998)
Author(s)
HJW Spoelder (External organisation)
F. M. Vos (TU Delft - ImPhys/Quantitative Imaging)
EM Petriu (External organisation)
FCA Groen (External organisation)
Research Group
ImPhys/Quantitative Imaging
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https://resolver.tudelft.nl/uuid:4cd024b1-a9e5-41c1-9ea3-3ed7cbed34c1
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Publication Year
1998
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
2-7
ISBN (print)
0780347978
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