Two-axis neutron and X-ray reflectivity

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Two-axis neutron and X-ray reflectivity

How to avoid alignment pitfalls and how to correct for them

Journal Article (1997)

Author(s)

Wim G. Bouwman (Technical University of Denmark (DTU))

Martin E. Vigild (Technical University of Denmark (DTU))

Eberhard Findeisen (Technical University of Denmark (DTU))

Kristian Kjaer (Technical University of Denmark (DTU))

Robert Feidenhans’l (Technical University of Denmark (DTU))

Elisabeth A.L. Mol (AMOLF Institute for Atomic and Molecular Physics)

Affiliation

External organisation

DOI related publication

https://doi.org/10.1080/10238169708200219 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:4d320757-5325-419a-ad62-ea87fc8fd4b4

More Info

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Publication Year

1997

Language

English

Affiliation

External organisation

Journal title

Journal of Neutron Research

Issue number

3

Volume number

5

Pages (from-to)

133-146

Downloads counter

52

Abstract

Sample alignment for neutron (and in some cases x-ray) reflectometry can be complicated due to a coupling between angle and position which occurs when slits are used to define the path of the beam. Misalignments in sample position or sample rotation angle give rise to systematic errors in the experiments. By measuring the reflectivity both from the back and from the front faces of the sample (twin reflectometry) these alignment errors can be detected and corrected for.