Size effects in the electrical transport of Si/SiGe devices induced by strain relaxation
Conference Paper
(1997)
Author(s)
PW Lukey (External organisation)
J Caro (TU Delft - QN/Fysics of NanoElectronics)
T Zijlstra (TU Delft - QN/Kavli Nanolab Delft)
EWJM van der Drift (TU Delft - QN/Kavli Nanolab Delft)
S Radelaar (TU Delft - OLD Metals Processing, Microstructures and Properties)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:4e133079-40b4-4d17-a8c7-b2775d7e0708
More Info
expand_more
expand_more
Publication Year
1997
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
47-53
No files available
Metadata only record. There are no files for this record.