Luminescent properties and microstructure of SiC doped AlON: Eu2+ phosphors
Liang Jun Yin (University of Electronic Science and Technology of China)
Chao Cai (Chengdu Fine Optical Engineering Research Center)
Hui Wang (University of Electronic Science and Technology of China)
Yu Zhao (Xiamen University)
Hao Van Bui (TU Delft - ChemE/Product and Process Engineering)
Xian Jian (University of Electronic Science and Technology of China)
Hui Tang (University of Electronic Science and Technology of China)
Xin Wang (University of Electronic Science and Technology of China)
Long Jiang Deng (University of Electronic Science and Technology of China)
Xin Xu (University of Science and Technology of China)
Ming Hsien Lee (Tamkang University)
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Abstract
Superior thermal quenching and degradation of phosphors are required for long lifetime lighting devices, such as light-emitting diodes, which can be realized through composition modification. Here, Al-N bonds in AlON: Eu2+ phosphors are substituted by higher bond order of Si-C. Photoluminescence (PL) results show thermal quenching (at 150 °C) and thermal degradation (after 600 °C treatment in air) are improved by 5% and 8% with a small decrease of PL intensity in 5% SiC doped AlON: Eu2+ phosphor. To explain these observations, first-principles computational study was performed to understand the Si and C configuration in AlON:Eu2+. The calculations reveal that Si and C elements are not randomly distributed in AlON lattice. It was found that Si prefers occupying tetrahedral sites (Td-Si) and the insertion of C in Td-Si is always energetically favorable, which results in the formation of SiC4 and SiNC3 clusters. Thus, the Al-N substitution by Si-C induces a stronger local structure, which accounts for the emission redshift and better thermal stability.
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