High Resolution Electron Microscopy: From Imaging Towards Measuring.

van Aert, S; Den Dekker, Arnold J.; van den Bos, A; Van Dyck, D

High Resolution Electron Microscopy: From Imaging Towards Measuring.

Conference paper (2001)

Authors

S van Aert Old - sect Systems, Signals and control Group (IST/MMR)

Arnold J. Den Dekker Old - sect Systems, Signals and control Group (IST/MMR)

A van den Bos Old - sect Systems, Signals and control Group (IST/MMR)

D Van Dyck External organisation

Research Group

Old - sect Systems, Signals and control Group (IST/MMR)

To reference this document use:

http://resolver.tudelft.nl/uuid:55e4e6d2-d297-4a4b-8320-3bc46aa9d120

More Info

expand_more

Published Date

2001

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Old - sect Systems, Signals and control Group (IST/MMR)

No files available

Metadata only record. There are no files for this conference paper.