High Resolution Electron Microscopy: From Imaging Towards Measuring.
Conference Paper
(2001)
Author(s)
S van Aert (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
Arnold J. den Dekker (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
A van den Bos (TU Delft - Old - sect Systems, Signals and control Group (IST/MMR))
D Van Dyck (External organisation)
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
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https://resolver.tudelft.nl/uuid:55e4e6d2-d297-4a4b-8320-3bc46aa9d120
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Publication Year
2001
Research Group
Old - sect Systems, Signals and control Group (IST/MMR)
Pages (from-to)
2081-2086
ISBN (print)
0-7803-6646-8
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