The use of neural network tools in statistical pattern recognition
Conference Paper
(1997)
Author(s)
RPW Duin (TU Delft - ImPhys/Quantitative Imaging)
EEE Frietman (TU Delft - ImPhys/Quantitative Imaging)
A. Y. Hoekstra (TU Delft - ImPhys/Quantitative Imaging)
R. Ligteringen (TU Delft - ImPhys/Quantitative Imaging)
D de Ridder (TU Delft - ImPhys/Quantitative Imaging)
M Skurichina (TU Delft - ImPhys/Quantitative Imaging)
David M. J. Tax (TU Delft - ImPhys/Quantitative Imaging)
A Ypma (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
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https://resolver.tudelft.nl/uuid:570695ac-df9d-4895-9546-feb4d28a394a
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Publication Year
1997
Research Group
ImPhys/Quantitative Imaging
Bibliographical Note
Progress in Neural Processing@en
Pages (from-to)
165-168
ISBN (print)
981-02-3338-8
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