Base-collector junction charge investigation of Si/SiGe HBT on thin film SOI
Conference Paper
(2005)
Author(s)
S Fregonese (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
G Avenier (External organisation)
C Maneux (External organisation)
A Chantre (External organisation)
T Zimmer (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
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https://resolver.tudelft.nl/uuid:589a80d2-153b-4f70-9c53-5d31a6e2221a
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Publication Year
2005
Research Group
Old - EWI Ch. Integrated Sensing Devices
Bibliographical Note
NEO@en
Pages (from-to)
153-156
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