Development of a high resolution topography and colour scannner
Applied to the craquelure pattern of paintings
Master Thesis
(2018)
Author(s)
M.J. van Hengstum (TU Delft - Mechanical Engineering)
Contributor(s)
Jo M.P. Geraedts – Mentor
J. Dik – Mentor
Y. Song – Mentor
D. Dodou – Mentor
T.T.W. Essers – Mentor
Faculty
Mechanical Engineering
Copyright
© 2018 Mathijs van Hengstum
To reference this document use:
https://resolver.tudelft.nl/uuid:5bb54961-85e3-4325-82d9-4329938ff193
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Publication Year
2018
Language
English
Copyright
© 2018 Mathijs van Hengstum
Graduation Date
10-07-2018
Awarding Institution
Delft University of Technology
Sponsors
Océ - A Canon Company,
Royal Picture Gallery Mauritshuis
Faculty
Mechanical Engineering
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