Thin Ag layers evaporated on a-Si, treated with oxygen and krypton
Report
(2003)
Author(s)
F.D. Tichelaar (TU Delft - QN/High Resolution Electron Microscopy)
T.R. de Kruijff (TU Delft - QN/High Resolution Electron Microscopy)
Research Group
QN/High Resolution Electron Microscopy
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Publication Year
2003
Research Group
QN/High Resolution Electron Microscopy
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