Thin ¿lm SOI HBT: A study of the effect of substrate bias on the electrical characteristics
Journal Article
(2006)
Author(s)
S Fregonese (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
G Avenier (External organisation)
C Maneux (External organisation)
A Chantre (External organisation)
T Zimmer (External organisation)
Research Group
Old - EWI Ch. Integrated Sensing Devices
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https://resolver.tudelft.nl/uuid:5e70486c-9c0a-4b5d-bb8b-8dc31d302f2d
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Publication Year
2006
Research Group
Old - EWI Ch. Integrated Sensing Devices
Volume number
50
Pages (from-to)
1673-1676
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