Continuous monitoring of tip radius during atomic force microscopy imaging
Conference Paper
(2015)
Author(s)
J Fraxedas (External organisation)
F. Perez-Murano (External organisation)
F Gramazio (External organisation)
M Lorenzoni (External organisation)
Enrique Rull Trinidad (TU Delft - Micro and Nano Engineering)
U. Staufer (TU Delft - Micro and Nano Engineering)
Research Group
Micro and Nano Engineering
DOI related publication
https://doi.org/10.1117/12.2196951
To reference this document use:
https://resolver.tudelft.nl/uuid:5ee4ead3-d834-4057-ac02-80c5ce1fa234
More Info
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Publication Year
2015
Language
English
Research Group
Micro and Nano Engineering
Pages (from-to)
1-7
ISBN (print)
9781628418460
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