Compact noise modeling of SiGe heterojunction bipolar transistors: Relevance of base-collector shot noise correlation and non-quasi static effects in the quasi-neutral emitter
Conference Paper
(2011)
Author(s)
F Vitale (TU Delft - Electronic Components, Technology and Materials)
R Pijper (External organisation)
R van der Toorn (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/BCTM.2011.6082776
To reference this document use:
https://resolver.tudelft.nl/uuid:638761d5-b98d-4cf9-a3d9-8e5f3bb4de68
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Publication Year
2011
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
179-182
ISBN (print)
978-1-61284-166-3
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