The future of value sensitive design

Conference paper (2020)

Authors

Batya Friedman University of Washington
David G. Hendry University of Washington
S. Umbrello University of Turin
M.J. van den Hoven Ethics & Philosophy of Technology - TPM
Daisy Yoo Aarhus University
Research Group
Ethics & Philosophy of Technology (TPM) (TU Delft)
Copyright: © 2020 Batya Friedman, David G. Hendry, S. Umbrello, M.J. van den Hoven, Daisy Yoo
Value sensitive design Grand challenges Responsible innovation Applied ethics Computing education Computing practice
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Published Date

2020

Language

English

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Faculty

Technology, Policy and Management

Department

Values Technology and Innovation

Research Group

Ethics & Philosophy of Technology