Exploiting Count Spectra for Bayesian Fault Localization
Conference Paper
(2010)
Author(s)
R.F. Lima Maranhao De Abreu (TU Delft - Software Engineering)
A Gonzalez Sanchez (TU Delft - Software Engineering)
A.J.C. van Gemund (TU Delft - Data-Intensive Systems)
Research Group
Software Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:674e87fb-55fd-4884-8358-bc36fd770a63
More Info
expand_more
expand_more
Publication Year
2010
Language
English
Research Group
Software Engineering
Pages (from-to)
1-22
ISBN (print)
978-1-4503-0404-7
No files available
Metadata only record. There are no files for this record.