Exploiting Count Spectra for Bayesian Fault Localization

Conference paper (2010)

Authors

R.F. Lima Maranhao De Abreu Software Engineering - EEMCS
A. Gonzalez Sanchez Software Engineering - EEMCS
A.J.C. van Gemund Data-Intensive Systems - EEMCS
Research Group
Software Engineering (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2010

Language

English

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Software Technology

Research Group

Software Engineering