Dielectric diffusion depth profiling: a method for assessing environmental degradation in epoxy coatings
Poster
(2004)
Author(s)
M Giacomelli (TU Delft - Old - sect Polymer Materials and Engineering (DCT/PME))
S.J. Picken (TU Delft - Old - sect Polymer Materials and Engineering (DCT/PME))
Jan Van Turnhout (TU Delft - Old - sect Polymer Materials and Engineering (DCT/PME))
Research Group
Old - sect Polymer Materials and Engineering (DCT/PME)
To reference this document use:
https://resolver.tudelft.nl/uuid:681974ec-ca28-49e5-845a-4dca57e2d0af
More Info
expand_more
expand_more
Publication Year
2004
Research Group
Old - sect Polymer Materials and Engineering (DCT/PME)
No files available
Metadata only record. There are no files for this record.