A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators

Journal Article (2018)
Author(s)

Behrouz Raftari Tangabi (TU Delft - Numerical Analysis)

Neil Budko (TU Delft - Numerical Analysis)

Cornelis Vuik (TU Delft - Numerical Analysis)

Research Group
Numerical Analysis
Copyright
© 2018 Behrouz Raftari Tangabi, N.V. Budko, Cornelis Vuik
DOI related publication
https://doi.org/10.1063/1.4994879
More Info
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Publication Year
2018
Language
English
Copyright
© 2018 Behrouz Raftari Tangabi, N.V. Budko, Cornelis Vuik
Research Group
Numerical Analysis
Issue number
1
Volume number
8
Pages (from-to)
1-24
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Abstract

This paper presents a modified self-consistent drift-diffusion-reaction
model suitable for the analysis of electron-beam irradiated insulators
at both short and long time scales. A novel boundary condition is
employed that takes into account the reverse electron current and a
fully dynamic trap-assisted generation-recombination mechanism is
implemented. Sensitivity of the model with respect to material
parameters is investigated and a calibration procedure is developed that
reproduces experimental yield-energy curves for uncharged insulators.
Long-time charging and yield variations are analyzed for stationary
defocused and focused beams as well as moving beams dynamically scanning
composite insulators.