2022 Spring/Summer ARFTG Microwave Measurement Conference
Journal Article
(2022)
Author(s)
Jeffrey Jargon (National Institute of Standards and Technology)
Jon Martens (Anritsu Corporation, Morgan Hill)
Andrej Rumiantsev (MPI Corporation, Chupei City)
Marco Spirito (TU Delft - Electronics)
Research Group
Electronics
Copyright
© 2022 Jeffrey A. Jargon, Jon Martens, Andrej Rumiantsev, M. Spirito
DOI related publication
https://doi.org/10.1109/MMM.2022.3148156
To reference this document use:
https://resolver.tudelft.nl/uuid:6b848704-3518-42b7-ae5c-711b68c2a15c
More Info
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Publication Year
2022
Language
English
Copyright
© 2022 Jeffrey A. Jargon, Jon Martens, Andrej Rumiantsev, M. Spirito
Research Group
Electronics
Issue number
5
Volume number
23
Pages (from-to)
133-134
Reuse Rights
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