2022 Spring/Summer ARFTG Microwave Measurement Conference

Journal article (2022)

Authors

Jeffrey Jargon National Institute of Standards and Technology
Jon Martens Anritsu Corporation, Morgan Hill
Andrej Rumiantsev MPI Corporation, Chupei City
M. Spirito Electronics - EEMCS
Research Group
Electronics (EEMCS) (TU Delft)
Copyright: © 2022 Jeffrey A. Jargon, Jon Martens, Andrej Rumiantsev, M. Spirito
DOI: https://doi.org/10.1109/MMM.2022.3148156
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Published Date

2022

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronics