Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample
Navid Abedzadeh (Massachusetts Institute of Technology)
M.A.R. Krielaart (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)
Chung Soo Kim (Massachusetts Institute of Technology)
John Simonaitis (Massachusetts Institute of Technology)
Richard Hobbs (Trinity College Dublin)
P. Kruit (TU Delft - ImPhys/Microscopy Instrumentation & Techniques)
Karl K. Berggren (Massachusetts Institute of Technology)
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Abstract
The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic electron mirror system under a sample in a conventional scanning electron microscope (SEM), we present a new imaging scheme which allows us to form scanned images of the top and bottom surfaces of the sample simultaneously. We believe that this imaging scheme could be of great value to the field of in-situ SEM which has been limited to observation of dynamic changes such as crack propagation and other surface phenomena on one side of samples at a time. We analyze the image properties when using a flat versus a concave electron mirror system and discuss two different regimes of operation. In addition to in-situ SEM, we foresee that our imaging scheme could open up avenues towards spherical aberration correction by the use of electron mirrors in SEMs without the need for complex beam separators.
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