Terahertz near-field microspectroscopy

Journal article (2010)
Department
Imaging Science and Technology (AS) (TU Delft)
Copyright: © 2010 The Author(s); American Institute of Physics
DOI: https://doi.org/doi:10.1063/1.3467192
Dielectric materials Circular waveguides Dielectric waveguides Near-field scanning optical microscopy
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Published Date

22-07-2010

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Source:

Applied Physics Letters, 97 (3), 2010

ISSN:

0003-6951

ISBN:

0003-6951

Source:

http://link.aip.org/link/APPLAB/v97/i3/p031115/s1

Faculty

Applied Sciences

Department

Imaging Science and Technology

Abstract

Using near-field, terahertz time-domain spectroscopy (THz-TDS), we investigate how the addition of a dielectric material into a subwavelength-diameter, cylindrical waveguide affects its transmission properties. The THz electric near-field is imaged with deep subwavelength resolution as it emerges from filled and unfilled waveguides. Spectroscopic data measured for waveguides filled with polycrystalline D-tartaric acid, and with polyethylene and silicon powders, illustrate the feasibility of this approach for obtaining spectroscopic information from a tiny sample volume.

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