EMC oxidation under high temperature aging

Book Chapter (2022)
Author(s)

A. Inamdar (TU Delft - Electronic Components, Technology and Materials)

Przemyslaw Gromala (Robert Bosch GmbH)

Alexandru Prisacaru (Robert Bosch GmbH)

Alexander Kabakchiev (Robert Bosch GmbH)

Yu-Hsiang Yang (University of Maryland)

Bongtae Han (University of Maryland)

Research Group
Electronic Components, Technology and Materials
Copyright
© 2022 A.S. Inamdar, Przemyslaw Jakub Gromala, Alexandru Prisacaru, Alexander Kabakchiev, Yu Hsiang Yang, Bongtae Han
DOI related publication
https://doi.org/10.1007/978-3-030-81576-9_3
More Info
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Publication Year
2022
Language
English
Copyright
© 2022 A.S. Inamdar, Przemyslaw Jakub Gromala, Alexandru Prisacaru, Alexander Kabakchiev, Yu Hsiang Yang, Bongtae Han
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. @en
Pages (from-to)
53-80
ISBN (print)
978-3-030-81575-2
ISBN (electronic)
978-3-030-81578-3
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

Epoxy molding compound (EMC) is widely used for encapsulating automotive electronics. Among all of the components of an electronic package, EMC is most exposed to the atmosphere, and thus undergoes aging. During high-temperature operation, EMC is oxidized, which alters its mechanical properties, and thus can affect the reliability of electronic components. This chapter focuses on four key aspects of EMC oxidation – (1) the growth of EMC oxidation layer, (2) the mechanical properties of oxidized EMC, (3) the effect of oxidized EMC on thermomechanical behavior of a molded package, and (4) the effect of EMC oxidation on solder joint reliability. This study utilizes various experimental characterization techniques as well as finite element simulation-based analysis.

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