A comparison of I-V characteristics of graphene silicon and graphene-porous silicon hybrid structures

Journal Article (2018)
Author(s)

M. Haditale (Alzahra University)

A. Zabihipour (Adiban University)

H. Koppelaar (TU Delft - Interactive Intelligence)

Research Group
Interactive Intelligence
DOI related publication
https://doi.org/10.1016/j.spmi.2018.07.005 Final published version
More Info
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Publication Year
2018
Language
English
Research Group
Interactive Intelligence
Volume number
122
Pages (from-to)
387-393
Downloads counter
116

Abstract

A novel Graphene/Porous Silicon hybrid device is fabricated and its electrical behaviors are studied along with a Graphene/Silicon device. Graphene (G) is prepared by exfoliation of graphite foil in aqueous solution of inorganic salt. Porous Silicon (PS) is fabricated by electrochemical etching of p-type Si. Graphene is deposited on the surface of Si and PS substrates by the Thermal Spray Pyrolysis (TSP) method. The current-voltage relationships of G/Si and G/PS devices are derived and studied under different volumes of graphene. The results reveal that there are important differences in the I–V characteristics of G/Si and G/PS devices in the forward as well as reverse bias. Furthermore, varying the volume of graphene deposition on Si and PS substrates have contrary effects on their I–V characteristics.