Investigation of capacitance transients in CuInS2 due to ionic migration
Journal Article
(2008)
Author(s)
R Loef (TU Delft - ChemE/Opto-electronic Materials)
J Schoonman (TU Delft - ChemE/Materials for Energy Conversion and Storage)
APLM Goossens (TU Delft - ChemE/Opto-electronic Materials)
Research Group
ChemE/Opto-electronic Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:701ab578-9535-4a87-90af-b774f0519126
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Publication Year
2008
Research Group
ChemE/Opto-electronic Materials
Volume number
92
Pages (from-to)
1579-1585
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