Chemical short-range order and lattice deformations in Mgy Ti1-y Hx thin films probed by hydrogenography
Robin Gremaud (Vrije Universiteit Amsterdam)
A. Baldi (Vrije Universiteit Amsterdam)
M Gonzalez-Silveira (Vrije Universiteit Amsterdam)
B. Dam (Vrije Universiteit Amsterdam)
Ronald Griessen (Vrije Universiteit Amsterdam)
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Abstract
A multisite lattice gas approach is used to model pressure-optical- transmission isotherms (PTIs) recorded by hydrogenography on Mgy Ti1-y Hx sputtered thin films. The model reproduces the measured PTIs well and allows us to determine the chemical short-range order parameter s. The s values are in good agreement with those determined from extended x-ray absorption fine structure measurements. Additionally, the PTI multisite modeling yields a parameter L that accounts for the local lattice deformations with respect to the average Mgy Ti1-y lattice given by Vegard's law. It is thus possible to extract two essential characteristics of a metastable alloy from hydrogenographic data.
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