Chemical short-range order and lattice deformations in Mgy Ti1-y Hx thin films probed by hydrogenography

Journal Article (2008)
Author(s)

Robin Gremaud (Vrije Universiteit Amsterdam)

A. Baldi (Vrije Universiteit Amsterdam)

M Gonzalez-Silveira (Vrije Universiteit Amsterdam)

B. Dam (Vrije Universiteit Amsterdam)

Ronald Griessen (Vrije Universiteit Amsterdam)

Affiliation
External organisation
DOI related publication
https://doi.org/10.1103/PhysRevB.77.144204
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Publication Year
2008
Language
English
Affiliation
External organisation
Issue number
14
Volume number
77

Abstract

A multisite lattice gas approach is used to model pressure-optical- transmission isotherms (PTIs) recorded by hydrogenography on Mgy Ti1-y Hx sputtered thin films. The model reproduces the measured PTIs well and allows us to determine the chemical short-range order parameter s. The s values are in good agreement with those determined from extended x-ray absorption fine structure measurements. Additionally, the PTI multisite modeling yields a parameter L that accounts for the local lattice deformations with respect to the average Mgy Ti1-y lattice given by Vegard's law. It is thus possible to extract two essential characteristics of a metastable alloy from hydrogenographic data.

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