Toward hardware-redundant, fault-tolerant logic for nanoelectrics
Journal Article
(2005)
Author(s)
J Han (TU Delft - ImPhys/Quantitative Imaging)
J. Gao (External organisation)
Pieter Jonker (TU Delft - ImPhys/Quantitative Imaging)
J.A.B. Fortes (External organisation)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:716dfc8a-16cc-446f-97a7-0ce80e8b612c
More Info
expand_more
expand_more
Publication Year
2005
Research Group
ImPhys/Quantitative Imaging
Issue number
4
Volume number
22
Pages (from-to)
328-339
No files available
Metadata only record. There are no files for this record.