RDE-based transistor-level gate simulation for statistical static timing analysis
Conference Paper
(2010)
Research Group
Signal Processing Systems
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https://resolver.tudelft.nl/uuid:780cfd49-25a1-4631-ad49-3681618a31b1
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Publication Year
2010
Language
English
Research Group
Signal Processing Systems
Pages (from-to)
787-792
ISBN (print)
978-1-4244-6677-1
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