Hot-carrier degradation analysis based on ring oscillators
Journal Article
(2006)
Author(s)
JC Wang (External organisation)
E Olthof (External organisation)
JW Metselaar (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
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https://resolver.tudelft.nl/uuid:7a00d520-9e82-4467-b787-922f365ff217
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Publication Year
2006
Research Group
Electronic Components, Technology and Materials
Volume number
46
Pages (from-to)
1858-1863
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