Atomic-resolution electron microscopy at ambient pressure
Conference Paper
(2008)
Author(s)
JF Creemer (TU Delft - Old - EWI Sect. ECTM)
S Helveg (External organisation)
AM Molenbroek (External organisation)
PM Sarro (TU Delft - Electrical Engineering, Mathematics and Computer Science)
HW Zandbergen (QN/High Resolution Electron Microscopy)
Research Group
Old - EWI Sect. ECTM
To reference this document use
https://resolver.tudelft.nl/uuid:7a4ccfd8-adb7-412c-b219-b0a0e9140ad2
More Info
expand_more
expand_more
Publication Year
2008
Research Group
Old - EWI Sect. ECTM
Pages (from-to)
197-198
Publisher
Springer
ISBN (print)
978-3-540-85225-4
Event
EMC 2008, Aachem, Germany (2008-09-01 - 2008-09-05), Aachem, Germany
Downloads counter
150
No files available
Metadata only record. There are no files for this record.