Atomic-resolution electron microscopy at ambient pressure
Conference Paper
(2008)
Author(s)
JF Creemer (TU Delft - Old - EWI Sect. ECTM)
S Helveg (External organisation)
AM Molenbroek (External organisation)
PM Sarro (TU Delft - Electronic Components, Technology and Materials)
HW Zandbergen (QN/High Resolution Electron Microscopy)
Research Group
Old - EWI Sect. ECTM
To reference this document use:
https://resolver.tudelft.nl/uuid:7a4ccfd8-adb7-412c-b219-b0a0e9140ad2
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Publication Year
2008
Research Group
Old - EWI Sect. ECTM
Pages (from-to)
197-198
Publisher
Springer
ISBN (print)
978-3-540-85225-4
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