SPICE simulation of single-electron electronics compared to measurement results

Conference Paper (2003)

Author(s)

R van Haar (TU Delft - Electronics)

Jaap Hoekstra (TU Delft - Electronics)

Research Group

Electronics

Elektrotechniek Vakpubl., Overig wet. > 3 pag Techniek

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Publication Year

2003

Research Group

Electronics

Pages (from-to)

190-194

ISBN (print)

90-73461-39-1

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