Characterization of microbial attachment on metal surfaces by Scanning Kelvin Probe and Epifluorescence Microscopy
Conference Paper
(2010)
Author(s)
A. Heyer (TU Delft - OLD Surface and Interface Engineering)
FD Souza (External organisation)
GM Ferrari (External organisation)
JMC Mol (TU Delft - OLD Surface and Interface Engineering)
Hans de Wit (TU Delft - OLD Surface and Interface Engineering)
Research Group
OLD Surface and Interface Engineering
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https://resolver.tudelft.nl/uuid:7d2a7f83-816d-4080-b932-979a11c69566
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Publication Year
2010
Research Group
OLD Surface and Interface Engineering
Pages (from-to)
1-9
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