Characterization of integrated optical strain sensors based on silicon waveguides
Journal Article
(2014)
Author(s)
W.J. Westerveld (TU Delft - ImPhys/Optics)
S.M. Leinders (ImPhys/Acoustical Wavefield Imaging )
PM Muilwijk (External organisation)
J. Pozo (External organisation)
TC van den Dool (External organisation)
M.D. Verweij (ImPhys/Acoustical Wavefield Imaging )
M. Yousefi (External organisation)
Paul Urbach (TU Delft - ImPhys/Optics)
Research Group
ImPhys/Optics
DOI related publication
https://doi.org/10.1109/JSTQE.2013.2289992
To reference this document use:
https://resolver.tudelft.nl/uuid:7fb9933e-1bc8-4536-bda9-fe2ff3278d68
More Info
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Publication Year
2014
Language
English
Research Group
ImPhys/Optics
Issue number
4
Volume number
20
Pages (from-to)
1-10
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