Electric-field screening in atomically thin layers of MoS 2
Journal Article
(2013)
Authors
A. Castellanos-Gomez (QN/Mol. Electronics & Devices)
E Cappelluti (External organisation)
R Roldán (External organisation)
N Agraït (External organisation)
F Guinea (External organisation)
G Rubio-Bollinger (External organisation)
Research Group
QN/Mol. Electronics & Devices
To reference this document use:
https://doi.org/10.1002/adma.201203731
TU Delft Repository resolver:
https://resolver.tudelft.nl/8052b74f-1e48-488d-ac01-fefd3a6eb54d
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Publication Year
2013
Language
English
Research Group
QN/Mol. Electronics & Devices
Issue number
6
Volume number
25
Pages (from-to)
899-903
DOI:
https://doi.org/10.1002/adma.201203731
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