Using the CFP-methodology for PP and PS angle dependent reflectivity analysis
Conference Paper
(2002)
Author(s)
AJ Berkhout (ImPhys/Acoustical Wavefield Imaging )
PLA Winthaegen (External organisation)
D. Verschuur (ImPhys/Acoustical Wavefield Imaging )
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Publication Year
2002
Pages (from-to)
265-268
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