A 2.2-ps Two-Dimensional Gated-Vernier Time-to-Digital Converter with Digital Calibration

Journal Article (2016)
Author(s)

Ping Lu (Lund University)

Y. Wu (TU Delft - Electronics)

P. Andreani (Lund University)

Research Group
Electronics
DOI related publication
https://doi.org/10.1109/TCSII.2016.2548218
More Info
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Publication Year
2016
Language
English
Research Group
Electronics
Issue number
11
Volume number
63
Pages (from-to)
1019-1023

Abstract

This brief presents a two-dimensional (2-D) Vernier time-to-digital converter (TDC) which uses two 3-stage gated ring oscillators (GROs) in the X/Y Vernier branches. The already small Vernier quantization noise (∼10.6 ps) is improved by the first-order noise shaping of the GRO. Moreover, since all the delay differences between the X and Y phases can be used (rather than only the diagonal line of the one-dimensional architecture), the intrinsic large latency time of the Vernier architecture is dramatically reduced. The TDC is implemented in a 65-nm CMOS process and consumes 2.3 mA from 1.0 V. The measured total noise integrated over a bandwidth of 1.25 MHz yields an equivalent TDC resolution of 2.2 ps, whereas the average latency time (within 2 ns) is less than 1/6 of that in a standard Vernier TDC.

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