A case study of ESD failures at random levels: analysis, explanation and solution
Journal Article
(2004)
Author(s)
HC Wu (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
T Smedes (External organisation)
JP extern Lokker (External organisation)
S-N Mei (External organisation)
JW Slotboom (TU Delft - Electronic Components, Technology and Materials)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:84e15eb4-9dd1-4348-a55e-afad3ff5fbd3
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Publication Year
2004
Research Group
Old - EWI Ch. Integrated Sensing Devices
Volume number
44
Pages (from-to)
1823-1827
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