A case study of ESD failures at random levels: analysis, explanation and solution

Journal article (2004)

Authors

HC Wu Old - EWI Ch. Integrated Sensing Devices
T Smedes External organisation
JP extern Lokker External organisation
S-N Mei External organisation
JW Slotboom Electronic Components, Technology and Materials - EEMCS
Research Group
Old - EWI Ch. Integrated Sensing Devices
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Published Date

2004

Language

Undefined/Unknown

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Research Group

Old - EWI Ch. Integrated Sensing Devices