Characterization of ultrasharp field emitters by projection microscopy
Journal Article
(1996)
Author(s)
MJ Fransen (TU Delft - ImPhys/Charged Particle Optics)
EPN Damen (External organisation)
C Schiller (External organisation)
TL van Rooy (External organisation)
HB Groen (External organisation)
Pieter Kruit (TU Delft - ImPhys/Charged Particle Optics)
Research Group
ImPhys/Charged Particle Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:85822d58-bfa0-49f9-9eef-f138513bec9b
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Publication Year
1996
Research Group
ImPhys/Charged Particle Optics
Volume number
94/95
Pages (from-to)
107-112
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