Analysis of the Inter-Stage Signal Leakage in Wide BW Low OSR and High DR CT MASH ΔΣM

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Analysis of the Inter-Stage Signal Leakage in Wide BW Low OSR and High DR CT MASH ΔΣM

Conference Paper (2020)

Author(s)

Qilong Liu (Eindhoven University of Technology)

Lucien J. Breems (Eindhoven University of Technology, NXP Semiconductors)

Shagun Bajoria (NXP Semiconductors)

Muhammed Bolatkale (NXP Semiconductors, TU Delft - Electrical Engineering, Mathematics and Computer Science)

Chenming Zhang (NXP Semiconductors)

Georgi Radulov (Eindhoven University of Technology)

Research Group

Electronic Instrumentation

DOI related publication

https://doi.org/10.1109/ISCAS45731.2020.9180951 Final published version

To reference this document use

https://resolver.tudelft.nl/uuid:8699a7f0-b4ef-4011-b293-62cbb0100c90

More Info

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Publication Year

2020

Language

English

Research Group

Electronic Instrumentation

Pages (from-to)

1-5

ISBN (print)

978-1-7281-3321-8

ISBN (electronic)

978-1-7281-3320-1

Event

ISCAS 2020: IEEE International Symposium on Circuits and Systems (2020-10-10 - 2020-10-21), Sevilla, Spain

Downloads counter

255

Abstract

This paper analyzes the error mechanisms that limit the dynamic range (DR) of wide-bandwidth, low-OSR continuous-time (CT) multi-stage noise-shaping (MASH) ΔΣM and proposes a tool, the Signal Leakage Function (SLF), to optimize the architecture, and hence improving DR. The SLF provides new insights on finding the key parameters which influence the inter-stage signal leakage and thus the inter-stage gain (IG). These insights would lead not only to increasing the overall dynamic range in a very power-efficient way, but also decreasing the performance sensitivity to mismatches and other variations.