Electron-beam-induced deformations of SiO2 nanostructures
Journal Article
(2005)
Author(s)
A.J. Storm (TU Delft - Old organisation QN/Moleculaire Biofysica)
JH Chen (TU Delft - QN/High Resolution Electron Microscopy)
XS Ling (External organisation)
H. W. Zandbergen (TU Delft - QN/High Resolution Electron Microscopy)
C. Dekker (TU Delft - Old organisation QN/Moleculaire Biofysica)
Research Group
Old organisation QN/Moleculaire Biofysica
To reference this document use:
https://resolver.tudelft.nl/uuid:897af1e7-2781-404c-bb9c-7068e55cffc4
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Publication Year
2005
Research Group
Old organisation QN/Moleculaire Biofysica
Issue number
1
Volume number
98
Pages (from-to)
014307-1-014307-8
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