Charge Carrier Trapping Processes and Deliberate Design of Afterglow Phosphors
Doctoral Thesis
(2017)
Author(s)
H Luo (TU Delft - RST/Fundamental Aspects of Materials and Energy)
Research Group
RST/Fundamental Aspects of Materials and Energy
Copyright
© 2017 H. Luo
To reference this document use:
https://doi.org/10.4233/uuid:89c1ddb9-db46-4664-a501-1125917d2622
More Info
expand_more
expand_more
Publication Year
2017
Language
English
Copyright
© 2017 H. Luo
Research Group
RST/Fundamental Aspects of Materials and Energy
ISBN (print)
978-94-6295-768-8
Reuse Rights
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
In this thesis, two different charge carrier trapping and detrapping processes are
investigated: (1) electron trapping and electron release; (2) hole trapping and hole
release. Both of these two processes can be used to “deliberate design” afterglow
phosphors or storage materials.