Characterization of a photonic strain sensor in silicon-on-insulator technology

Journal article (2012)

Authors

W.J. Westerveld ImPhys/Optics - AS
J. Pozo External organisation
Peter Harmsma External organisation
R. Schmits External organisation
E. Tabak External organisation
TC van den Dool External organisation
Paul Urbach ImPhys/Optics - AS
M. Yousefi External organisation
Research Group
ImPhys/Optics (AS) (TU Delft)
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Published Date

2012

Language

English

Reuse Rights

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Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Optics