RF small signal avalanche characterization and repercussions on bipolar transistor circuit design: Characterization, modeling and repercussions
Journal Article
(2010)
Author(s)
V Milovanovic (TU Delft - Electronic Components, Technology and Materials)
Ramses van der Toorn (TU Delft - Electronic Components, Technology and Materials)
R Pijper (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1016/j.microrel.2010.10.006
To reference this document use:
https://resolver.tudelft.nl/uuid:8cfd1216-4c09-4486-8314-1e5b15beb921
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-6
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