An adaptive Cu trace fatigue model based on average cross-section strain
Journal Article
(2013)
Author(s)
DM Farley (TU Delft - Electronic Components, Technology and Materials)
Y Zhou (External organisation)
A. Dasgupta (External organisation)
JWC de Vries (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1016/j.microrel.2012.06.114
To reference this document use:
https://resolver.tudelft.nl/uuid:8fa66ab0-0bdf-4e94-aba4-36c95a6f3ec2
More Info
expand_more
expand_more
Publication Year
2013
Language
English
Research Group
Electronic Components, Technology and Materials
Issue number
11
Volume number
52
Pages (from-to)
2763-2772
No files available
Metadata only record. There are no files for this record.