An adaptive Cu trace fatigue model based on average cross-section strain

Farley, D.M.; Zhou, Y; Dasgupta, A.; de Vries, JWC

An adaptive Cu trace fatigue model based on average cross-section strain

Journal article (2013)

Authors

D.M. Farley Electronic Components, Technology and Materials

Y Zhou External organisation

A. Dasgupta External organisation

JWC de Vries External organisation

Research Group

Electronic Components, Technology and Materials

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Published Date

2013

Language

English

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Research Group

Electronic Components, Technology and Materials

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