Supervised Segmentation of Textures in Backscatter Images

Conference Paper (2002)
Author(s)

P Paclik (TU Delft - ImPhys/Quantitative Imaging)

Bob Duin (TU Delft - ImPhys/Quantitative Imaging)

GMP van Kempen (TU Delft - ImPhys/Quantitative Imaging)

R Kohlus (External organisation)

Research Group
ImPhys/Quantitative Imaging
More Info
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Publication Year
2002
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
490-493
ISBN (print)
0-7695-1696-3

Abstract

In this paper we present an application of statistical pattern recognition for segmentation of backscatter images (BSE) in product analysis of laundry detergents. Currently, application experts segment BSE images interactively which is both time consuming and expert dependent. We present a new, automatic, procedure for supervised BSE segmentation which is trained using additional multi-spectral EDX images. Each time a new feature selection procedure is employed to find a convenient feature subset for a particular segmentation problem. The performance of the presented algorithm is evaluated using ground-truth segmentation results. It is compared with that of interactive segmentation performed by the analyst.

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