Two microscopes integrated in one : simultaneous correlative light and electron microscopy
Journal Article
(2013)
Author(s)
Jacob Hoogenboom (TU Delft - ImPhys/Charged Particle Optics)
AC Zonnevylle (TU Delft - ImPhys/Charged Particle Optics)
N Liv Hamarat (TU Delft - ImPhys/Charged Particle Optics)
P. Kruit (TU Delft - ImPhys/Charged Particle Optics)
Research Group
ImPhys/Charged Particle Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:91143108-280d-4011-891c-1663b011134a
More Info
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Publication Year
2013
Language
English
Research Group
ImPhys/Charged Particle Optics
Issue number
2
Volume number
15
Pages (from-to)
30-32
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