The relation between the defect structure, the surface roughness and the growth conditions of YBa2Cu3O7-δ films

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The relation between the defect structure, the surface roughness and the growth conditions of YBa₂Cu₃O_7-δ films

Journal Article (1997)

Author(s)

B. Dam (Vrije Universiteit Amsterdam)

C. Træholt

B. Stäuble-Pümpin (Vrije Universiteit Amsterdam)

J. Rector (Vrije Universiteit Amsterdam)

D. G. De Groot (Vrije Universiteit Amsterdam)

Surface roughness Defect structure Growth conditions YBaCuO Films

DOI related publication

https://doi.org/10.1016/S0925-8388(96)02764-8 Final published version

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https://resolver.tudelft.nl/uuid:91d6e1b0-05e2-4bdb-a918-f5d8ba83fef5

More Info

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Publication Year

1997

Language

English

Issue number

1-2

Volume number

251

Pages (from-to)

27-30

Downloads counter

187

Abstract

YBa₂Cu₃O_7-δ films on SrTiO₃ are characterized by a network of anti-phase boundaries (APB's), protruding from the interface to the film surface. We propose that the island morphology of these films is to a large extent determined by this network. At APB-outcrops deep trenches form which separate the growth islands. At the cross-section of three APB's deep holes are formed. It is found that the growth island size can be increased by increasing the substrate temperature or the oxygen pressure during growth.