The relation between the defect structure, the surface roughness and the growth conditions of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-δ</sub> films

Journal article (1997)

Authors

B. Dam Vrije Universiteit Amsterdam
B Stäuble-Pümpin Vrije Universiteit Amsterdam
Jan H. Rector Vrije Universiteit Amsterdam
D. G. de Groot Vrije Universiteit Amsterdam
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Surface roughness Defect structure Growth conditions YBaCuO Films
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Published Date

1997

Language

English

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Abstract

YBa2Cu3O7-δ films on SrTiO3 are characterized by a network of anti-phase boundaries (APB's), protruding from the interface to the film surface. We propose that the island morphology of these films is to a large extent determined by this network. At APB-outcrops deep trenches form which separate the growth islands. At the cross-section of three APB's deep holes are formed. It is found that the growth island size can be increased by increasing the substrate temperature or the oxygen pressure during growth.