Yield predictions in process equipment: an FDF/LES approach
Journal Article
(2004)
Author(s)
E van Vliet (TU Delft - Old - sect Kramers Laboratory (MSP/FT))
Research Group
Old - sect Kramers Laboratory (MSP/FT)
To reference this document use:
https://resolver.tudelft.nl/uuid:926a8765-fe95-4276-bc0f-608f257b4757
More Info
expand_more
expand_more
Publication Year
2004
Research Group
Old - sect Kramers Laboratory (MSP/FT)
Issue number
5
Volume number
11
Pages (from-to)
18-21
No files available
Metadata only record. There are no files for this record.