On the nonlinearity of pattern classifiers

Conference Paper (1996)
Author(s)

A Hoekstra (TU Delft - ImPhys/Quantitative Imaging)

Bob Duin (TU Delft - ImPhys/Quantitative Imaging)

Research Group
ImPhys/Quantitative Imaging
More Info
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Publication Year
1996
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
271-275
ISBN (print)
0-8186-7472-5

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