On the nonlinearity of pattern classifiers
Conference Paper
(1996)
Author(s)
A Hoekstra (TU Delft - ImPhys/Quantitative Imaging)
Bob Duin (TU Delft - ImPhys/Quantitative Imaging)
Research Group
ImPhys/Quantitative Imaging
To reference this document use:
https://resolver.tudelft.nl/uuid:933b3e42-5890-4277-84bf-badc34519689
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Publication Year
1996
Research Group
ImPhys/Quantitative Imaging
Pages (from-to)
271-275
ISBN (print)
0-8186-7472-5
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