In situ stress measurements and mechanical properties of a composition range of NiTi thin films deposited at elevated temperature
Journal Article
(2012)
Authors
V.G. Kotnur (TU Delft - Micro and Nano Engineering)
Guido Janssen (TU Delft - Micro and Nano Engineering)
Research Group
Micro and Nano Engineering
To reference this document use:
https://resolver.tudelft.nl/9585b436-4842-4a38-9e11-fe508c9cc831
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Publication Year
2012
Language
English
Research Group
Micro and Nano Engineering
Volume number
211
Pages (from-to)
167-171
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