Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminum oxide layers
Journal Article
(2004)
Author(s)
J van den Brand (TU Delft - OLD Surface and Interface Engineering)
W.G. Sloof (TU Delft - OLD Virtual Materials and Mechanics)
H. Terryn (TU Delft - OLD Surface and Interface Engineering)
J.H.W. de Wit (TU Delft - OLD Surface and Interface Engineering)
Research Group
OLD Surface and Interface Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:97da6d83-2b99-42b0-8d75-6417988769a7
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Publication Year
2004
Research Group
OLD Surface and Interface Engineering
Volume number
36
Pages (from-to)
81-88
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