Infrared achromatic phase shifters using modulated total internal reflection
Dimitri Mawet (Sart Tilman B52)
C. Lenaerts (Sart Tilman B52)
Pierre Riaud (Sart Tilman B52)
Denis Vandormae (Sart Tilman B52)
Jérôme Loicq (Sart Tilman B52)
David Verstraeten (Sart Tilman B52)
Karl Fleury (Sart Tilman B52)
Serge Habraken (Sart Tilman B52)
J. Surdej (Sart Tilman B52)
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Abstract
We propose a new family of achromatic phase shifters that uses the modulated total internal reflection (TIR) phenomenon. These components can be seen as enhanced Fresnel rhombs for infrared applications like nulling interferometry and polarimetry. The TIR phenomenon comes with a differential phase shift between the polarization components of the incident light. Modulating the index transition at the TIR interface allows compensating for the intrinsic material dispersion in order to make the subsequent phase shift achromatic over broad bands. The modulation can be induced by a thin film of a well-chosen medium or a subwavelength grating whose parameters are specially optimized. We present results from theoretical simulations together with preliminary fabrication outcomes.
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