Base resistance distribution in bipolar transistors, relevance to compact noise modeling and extraction from admittance parameters
Conference Paper
(2010)
Author(s)
F Vitale (TU Delft - Electronic Components, Technology and Materials)
R Pijper (External organisation)
R van der Toorn (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/BIPOL.2010.5667931
To reference this document use:
https://resolver.tudelft.nl/uuid:9af13361-8597-4ac1-a7a1-5a8fbee57051
More Info
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
161-164
ISBN (print)
978-1-4244-8578-9
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